DUAL-OP

Accessory

Set of Optical Pinholes for P700 Measurements

When leaf samples are smaller than the crossectional area of the measuring beam, the measuring light bypassing the leaf diminishes the P700 signal quality. To prevent the negative effects of bypassing measuring light, we offer a set of optical pinholes (DUAL-OP) to adjust the crossectional area of the measuring beam to the sample area.

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